Technical Report Number
The past decade has seen considerable advances in the application of principles from projective geometry to problems in image analysis and computer vision. In this paper, we review a subset of this work, and leverage these results for the purpose of forensic analysis. Specifically, we review three techniques for making metric measurements on planar surfaces from a single image. The resulting techniques should prove useful in forensic settings where real-world measurements are required.
Dartmouth Digital Commons Citation
Johnson, Micah K. and Farid, Hany, "Metric Measurements on a Plane from a Single Image" (2006). Computer Science Technical Report TR2006-579. https://digitalcommons.dartmouth.edu/cs_tr/288