Title

Determining Conversion Gain and Read Noise Using a Photon-Counting Histogram Method for Deep Sub-Electron Read Noise Image Sensors

Document Type

Article

Publication Date

5-1-2016

Publication Title

Institute of Electrical and Electronics Engineers Journal of The Electron Devices Society

Abstract

A new method for characterizing deep sub-electron read noise image sensors is reported. This method, based on the photon-counting histogram, can provide easy, independent and simultaneous measurements of the quanta exposure, conversion gain, and read noise. This new method provides a more accurate measure of conversion gain and read noise over conventional characterization techniques for image sensors with read noise from 0.15-0.40e- rms.

DOI

10.1109/JEDS.2016.2536719

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