Document Type
Technical Report
Publication Date
8-1-2006
Technical Report Number
TR2006-579
Abstract
The past decade has seen considerable advances in the application of principles from projective geometry to problems in image analysis and computer vision. In this paper, we review a subset of this work, and leverage these results for the purpose of forensic analysis. Specifically, we review three techniques for making metric measurements on planar surfaces from a single image. The resulting techniques should prove useful in forensic settings where real-world measurements are required.
Dartmouth Digital Commons Citation
Johnson, Micah K. and Farid, Hany, "Metric Measurements on a Plane from a Single Image" (2006). Computer Science Technical Report TR2006-579. https://digitalcommons.dartmouth.edu/cs_tr/288
