Determining Conversion Gain and Read Noise Using a Photon-Counting Histogram Method for Deep Sub-Electron Read Noise Image Sensors
Document Type
Article
Publication Date
5-1-2016
Publication Title
Institute of Electrical and Electronics Engineers Journal of The Electron Devices Society
Department
Thayer School of Engineering
Abstract
A new method for characterizing deep sub-electron read noise image sensors is reported. This method, based on the photon-counting histogram, can provide easy, independent and simultaneous measurements of the quanta exposure, conversion gain, and read noise. This new method provides a more accurate measure of conversion gain and read noise over conventional characterization techniques for image sensors with read noise from 0.15-0.40e- rms.
DOI
10.1109/JEDS.2016.2536719
Dartmouth Digital Commons Citation
Starkey, Dakota A. and Fossum, Eric R., "Determining Conversion Gain and Read Noise Using a Photon-Counting Histogram Method for Deep Sub-Electron Read Noise Image Sensors" (2016). Dartmouth Scholarship. 387.
https://digitalcommons.dartmouth.edu/facoa/387
