Photon Counting Error Rates in Single-Bit and Multi-Bit Quanta Image Sensors
Document Type
Article
Publication Date
5-1-2016
Publication Title
Institute of Electrical and Electronics Engineers Journal of The Electron Devices Society
Department
Thayer School of Engineering
Abstract
Photon or photoelectron counting error (bit error) rates are determined for single-bit and multi-bit quanta image sensors (QISs). The results are also applicable to CMOS image sensors with deep sub-electron read noise. The effects of read noise, gain variation, and quanta exposure level on the counting errors (bit errors) in a QIS device are investigated. The interaction of these factors yields complex behavior of the counting error rate. Still, photon-counting is predicted to be remarkably accurate for quanta exposures greater than unity despite read noise and conversion-gain variation, and accurate at very low-light levels if the read noise is less than 0.15e- r.m.s.
DOI
10.1109/JEDS.2016.2536722
Dartmouth Digital Commons Citation
Fossum, Eric R., "Photon Counting Error Rates in Single-Bit and Multi-Bit Quanta Image Sensors" (2016). Dartmouth Scholarship. 388.
https://digitalcommons.dartmouth.edu/facoa/388
