Title

Photon Counting Error Rates in Single-Bit and Multi-Bit Quanta Image Sensors

Document Type

Article

Publication Date

5-1-2016

Publication Title

Institute of Electrical and Electronics Engineers Journal of The Electron Devices Society

Department

Thayer School of Engineering

Abstract

Photon or photoelectron counting error (bit error) rates are determined for single-bit and multi-bit quanta image sensors (QISs). The results are also applicable to CMOS image sensors with deep sub-electron read noise. The effects of read noise, gain variation, and quanta exposure level on the counting errors (bit errors) in a QIS device are investigated. The interaction of these factors yields complex behavior of the counting error rate. Still, photon-counting is predicted to be remarkably accurate for quanta exposures greater than unity despite read noise and conversion-gain variation, and accurate at very low-light levels if the read noise is less than 0.15e- r.m.s.

DOI

10.1109/JEDS.2016.2536722

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